Characterization of nanolloids by atomic spectrometry combined with different separation techniques: new horizons of good old analytics

Alexei Plotnikov

Helmholtz-Zentrum Berlin für Materialien und Energie GmbH, Institute of Functional Materials, Berlin, Germany

The optimization of the synthesis of colloidal semiconductor nanocrystals requires the information both on the size distribution of constituent particles and their elemental composition. However the most techniques used for these purposes do not satisfy all the requirements in full measure being either time-consuming or inaccurate, or insufficiently informative. Thus the problem of express simultaneous determination of both the particle size distribution and elemental composition of nanocolloids still remains a challenge. A solution to the rapid characterization of nanocolloids involving inductively coupled plasma mass spectrometry (ICP-MS) as a detection technique is suggested. ICP-MS was operating either in a single-particle detection mode or in a combination with different separation techniques such as gel electrophoresis or field-flow fractionation. The applicability of the approaches was tested on the model nanocolloid systems. The theoretical basics as well as practical application of the suggested methods are discussed in details.

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