| speaker: | Theo A. Costi Jülich, Germany |
| time: | Th., 23.08, 11:20-12:10 |
collaborators: T. Micklitz, A. Altland, A. Rosch, L. Saminadayar, F. Mallet, C. Bäuerle
Recently, progress has been made in understanding electronic dephasing due to scattering from dynamical defects. Here, we present analytic and numerical results for the temperature dependence of the dephasing rate of electrons due to scattering from a dilute concentration of magnetic impurities in a weakly disordered metal [1]. We compare the temperature dependence of the dephasing rates for underscreened, fully screened and overscreened Kondo models with recent weak localization measurements for Fe impurities in Ag wires [2]. Surprisingly good agreement is found for the fully screened case, whereas we can rule out the possibility that most Fe impurities in Ag are underscreened or overscreened.
[1] T. Micklitz, A. Altland, T. A. Costi and A. Rosch, Phys. Rev. Lett. 96, 226601 (2006); T. Micklitz, T. A. Costi and A. Rosch, Phys. Rev. B 75, 054406 (2007).
[2] F. Mallet, J. Ericsson, D. Mailly, S. Uenluebayir, D. Reuter, A. Melnikov, A. D. Wieck, T. Micklitz, A. Rosch, T.A. Costi, L. Saminadayar, and C. Baeuerle, Phys. Rev. Lett. 97, 226804 (2006).