| speaker: | Alexander Schneider Max-Planck-Institut für Festkörperforschung, Stuttgart, Germany |
| time: | Tu. 01.04.03, 9:00 - 10:00 |
The Scanning Tunneling Microscope (STM) has proven its great potential in providing insight into the atomic and electronic structure of surfaces and adsorbates at surfaces. Scanning Tunneling Spectroscopy (STS) is used to investigate the electronic properties of clean surfaces and especially defects at surfaces. I will discuss STS from the experimental point of view, e.g. what procedures are used to extract a true defect related signal and where the practical limitations of the technique are. I will also review techniques which are used or can potentially be used to image single magnetic impurities on the atomic level and study their interaction with the substrate or host system.